Grenoble, France - October 09, 2017 - For RFID Tags, dynamic power consumption is a critical performance as the capability to lower power translates into a wider range of detection (RFID tag read range) and a highest identification rate in the same range.
One of the main degree of freedom to improve power consumption of RFID chips is to optimize the digital part of the design.
The new generation of SESAME eLC standard-cell library at 180 nm is designed to safely operate near threshold voltage, down to 0.68 V +/- 10%, to provide up to 99% of dynamic power savings compared to sponsored library.
Such a comparison must be based on the Motu-Uta public benchmark to provide an objective metric to quickly assess the expected improvement.
Motu-Uta, the first benchmark for standard-cell libraries, is downloadable
here with no need for NDA.
Picture 1: SESAME eLC compared to a conventional standard-cell library (Dynamic Power Consumption versus Frequency) at 180 nm RFID.
