New NI WiGig test solution helps propel multi-Gigabit, low-latency wireless chipset development
AUSTIN, Texas — (BUSINESS WIRE) — September 20, 2016 — NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today a technology preview of its new 802.11ad, or WiGig, test solution at EDI CON USA 2016. Highlighting new capabilities in the emerging field of mmWave test, NI is demonstrating parametric testing of an 802.11ad radio using its mmWave instrument technology.
This demonstration of a new 802.11ad test solution is based on NI’s wideband mmWave transceiver technology used by leading automotive and wireless infrastructure researchers to prototype advanced radar and 5G systems. It consists of a vector signal generator and vector signal analyzer operating at 55 to 68 GHz with more than 2 GHz of instantaneous bandwidth. This new technology for 802.11ad testing also complements NI’s comprehensive product portfolio for wireless test, including existing solutions testing 802.11a/b/h/j/n/p/ac/ax, Bluetooth, GSM, UMTS, LTE/LTE-A, FM/RDS, GNSS and more.
“With proposed 5G bands at 28, 38, and 73 GHz, WiGig at 60 GHz, and automotive radar at 77 GHz, mmWave is the next frontier of wideband instrument technology,” said Jin Bains, vice president of RF R&D at NI. “With our newest 802.11ad test solution, we are excited to work alongside leading chipset vendors to develop new solutions for the next generation of wireless test.”
NI’s mmWave transceiver technology introduces a new approach to 802.11ad testing that offers customers an alternative to slow, expensive and low-performing traditional instruments. To further refine this technology, NI is working with leading semiconductor vendors as part of a lead user program.
“802.11ad is a critical addition complementing WiFi technology, enabling multi-gigabit wireless throughput for demanding consumer and mobile applications such as UHD video streaming, as well as enabling high bandwidth data transmission for wireless infrastructure including mobile backhaul and wireless access points,” said Anand Iyer, director of mmWave product marketing at Broadcom Limited. “NI’s developments in mmWave test solutions have allowed us to address various testing challenges like reducing test costs and providing high-volume manufacturing and over-the-air test capabilities.”
The 802.11ad test solution is a vital part of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems benefit from more than 600 PXI products ranging from DC to mmWave and feature high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. Engineers can take advantage of the development productivity of the LabVIEW and TestStand software environments, along with the out-of-the-box experience with interactive soft front panels for making basic measurements and debugging. Supported by a vibrant ecosystem of partners, add-on IP and applications engineers, the NI platform helps to significantly lower the cost of test, reduce time to market and future-proof testers for tomorrow’s challenging requirements.
To see a demonstration of this new 802.11ad test solution, visit NI’s booth #313 at EDI CON USA 2016, or find more information about NI’s RF and wireless solutions at www.ni.com/rf.
About NI
Since 1976, NI ( www.ni.com) has made it possible for engineers and scientists to solve the world’s greatest engineering challenges with powerful platform-based systems that accelerate productivity and drive rapid innovation. Customers from a wide variety of industries – from healthcare to automotive and from consumer electronics to particle physics – use NI’s integrated hardware and software platform to improve the world we live in.
LabVIEW, National Instruments, NI, ni.com and NI TestStand are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.
View source version on businesswire.com: http://www.businesswire.com/news/home/20160920005679/en/
Contact:
NI
Beth Williams, 512-683-6394
Email Contact
