Keysight Technologies’ Boundary Scan Analyzer Will Support Intel® Microarchitecture Codenamed Skylake

Helps Electronics Designers, Manufacturers Test Boards with Microprocessor Architecture Using Boundary Scan, Intel® Silicon View Technology

SANTA ROSA, Calif. — (BUSINESS WIRE) — April 20, 2015 — Keysight Technologies, Inc. (NYSE: KEYS) today announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel® microarchitecture codenamed Skylake.

The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT).

Test engineers who need a powerful yet easy to use solution for developing their products based on the Intel microarchitecture codenamed Skylake will find the x1149 boundary scan analyzer a viable option to solve the test challenges of extremely limited test access of complex PCBAs with high-speed devices.

More information about the x1149 is available at www.keysight.com/find/x1149.

Images of the x1149 are available at www.keysight.com/find/x1149_images.

About Keysight Technologies

Keysight Technologies (NYSE: KEYS) is a global electronic measurement technology and market leader helping to transform its customers’ measurement experience through innovations in wireless, modular, and software solutions. Keysight’s electronic measurement instruments, systems, software and services are used in the design, development, manufacture, installation, deployment and operation of electronic equipment. The business had revenues of $2.9 billion in fiscal year 2014. Information about Keysight is available at www.keysight.com.

NOTE TO EDITORS: Further technology, corporate citizenship and executive news is available at www.keysight.com/go/news.



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